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Item Statistics

Strain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperature

RepositoryUniversity of Queensland [UQ eSpace]
URLhttps://espace.library.uq.edu.au/view/UQ:221982
Author(s)Glasko, J. M.; Zou, J.; Cockayne, D. J. H.; Fitz Gerald, J. D.
Item typeArticle
JournalApplied Physics Letters, Print_ISSN:0003-6951, Online_ISSN:1077-3118
DOIhttps://doi.org/10.1063/1.122018

Usage Date Range

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Reporting Period Total 2021-12-22 2021-12-23 2021-12-24 2021-12-25 2021-12-26 2021-12-27 2021-12-28 2021-12-29 2021-12-30 2021-12-31 2022-01-01
3 1 0 1 0 0 0 0 0 0 0 1
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