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Item Statistics

Transmission electron microscopy characterization of secondary defects created by MeV Si, Ge, and Sn implantation in silicon

RepositoryUniversity of Queensland [UQ eSpace]
URLhttps://espace.library.uq.edu.au/view/UQ:250017
Author(s)Wong-Leung, J; Fatima, S; Jagadish, C; Fitz Gerald, JD; Chou, CT; Zou, J; Cockayne, DJH
Item typeArticle
JournalJournal of Applied Physics, Print_ISSN:0021-8979, Online_ISSN:1089-7550
DOIhttps://doi.org/10.1063/1.373819

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Reporting Period Total 2021-12-19
1 1
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