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Formation of planar defects over GeSi islands in Si capping layer grown at low temperature

RepositoryUniversity of Queensland [UQ eSpace]
URLhttps://espace.library.uq.edu.au/view/UQ:181803
Author(s)Lin, J. H.; Wu, Y. Q.; Cui, J.; Fan, Y. L.; Yang, X. J.; Jiang, Z. M.; Chen, Y.; Zou, J.
Item typeArticle
JournalJournal of Applied Physics, Print_ISSN:0021-8979, Online_ISSN:1089-7550
DOIhttps://doi.org/10.1063/1.3068192

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